IJSER Home >> Journal >> IJSER
International Journal of Scientific and Engineering Research
ISSN Online 2229-5518
ISSN Print: 2229-5518 2    
Website: http://www.ijser.org
scirp IJSER >> Volume 3,Issue 2,February 2012
Morphology of YSZ Thin Films on Ag Substrat
Full Text(PDF, )  PP.59-63  
Shirley Tiong Palisoc, Rose Ann Tegio, Michelle Natividad, Simon Gerard Mendiola Benjamin Tuason, Kevin Kaw and Stephen Tadios 
YSZ, spin-coating, thin film, Raman spectroscopy, x-ray diffraction(XRD), scanning electron microscopy (SEM)
Different concentrations of yttria stabilized zirconia (YSZ) grown on silver (Si) substrate was investigated in this paper. Suspension containing I0wt%, 30wt% and 50wt% YSZ were fabricated using the spin coating technique on silver keeping all other parameters constant such as the coating parameters and sintering temperature. The surface morphology and thickness of the films were investigated using scanning electron microscopy (SEM). Results showed porous YSZ films which become less porous as the concentration of YSZ increases. The thickness of the films was also affected by the YSZ concentration. As the concentration increases, the thickness of the films also increases. The crystal structure of the fabricated films was also determined using X-ray Diffraction (XRD) and Raman Spectroscopy. Both techniques revealed a cubic fluorite structure independent of the concentration of YSZ.
[1] Statistics Division of the Department of Economic and Social Affairs of the United Nations Secretariat, Population and Vital Statistics Report, 2009, Series A61 (2)

[2] Energy Information Administration, International Energy Outlook 2009, pp. 17, 2009

[3] A. Boudghene Stambouli and E. Traversa, “Solid oxide fuel cells (SOFCs): a review of an environmentally clean and efficient source of energy”, Renewable and Sustainable Energy Reviews, 6(5), pp. 433-455, 2002

[4] S. C. Singhal, “Zirconia Electrolyte-based Solid Oxude Fuel Cells”, Encyclopedia of Materials: Science and Tehcnology, pp. 9898- 9902, 2001

[5] X. Xu, S. Huang, and D. Peng, “YSZ thin films deposited by spincoating for IT-SOFCs”, Ceramics International, 31, pp. 1061-1064, 2005

[6] K. Chen et al., “Fabrication and performance of anode-supported YSZ films by slurry spin coating”, Solid State Ionics, 177, pp.3455- 3460, 2007

[7] Z. Ogumi et al., “Preparation of thin yttria-stablized zirconia films by vapor phase electrolytic deposition”, Solid State Ionics, 58(3-4), pp. 345-350, 1992

[8] G. Laukaitis et al., “YSZ thin films deposited by e-beam technique”, Thin Solid Film, 515(2), pp. 678-682, 2006

[9] M.F. Garcia-Sanchez et al., “Nanostructured YSZ thin films for solid oxide fuel cells deposited by ultrasonic spray pyrolysis”, Solid State Ionic, 179 (7-8), pp. 243-249, 2008

[10] B. Hobein et al., “DC Sputtering of yttria-stabilized zirconia films for solid oxide fuel cell applications”, Journal of the European Ceramic Society, 21 (10-11), pp. 1843-1846, 2001

[11] T. Priyatham and R. Bauri, “Synthesis and characterization of nanocrystalline Ni–YSZ cermet anode for SOFC”, Materials Characterization 61 (54-58), 2010

[12] P. S. Lee , et al., “In situ XRD analysis of Ni(Pt)/Si(100) reactions in low temperature regime ≤ 400oC”, Solid State Comunications, 128, pp. 325-328, 2003

[13] J.R. Connolly, “Introduction Quantitative X-Ray Diffraction Methods”, 2010

[14] A. Ghosh et al., “Nanocrystalline zirconia-yttria system-a Raman study”, Materials Letters, 60, pp. 1170-1173, 2006

[15] Z. Cheng and M. Liu, “Characterization of sulphur poisoning of Ni-YSZ anodes for solid oxide fuel cells using in situ Raman microspectroscopy”, Solid State Ionics, 178, pp. 925-935, 2007

[16] C.C. Umback and M.A. Hines, “Applications of Raman Spectroscopy”,http://www.ccmr.cornell.edu/igert/modular/docs/ Appl_of_Raman_Spectroscopy, 2009

Untitled Page