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International Journal of Scientific and Engineering Research
ISSN Online 2229-5518
ISSN Print: 2229-5518 10    
Website: http://www.ijser.org
scirp IJSER >> Volume 2, Issue 10, October 2011 Edition
Resistivity Measurements of Conductors and Semiconductors of Different Geometrical Shapes Using Van der Pauw Technique
Full Text(PDF, 3000)  PP.  
Amir J. Majid
resistivity, Van der Pauw, conductors, semiconductors, shapes, geometries, equation derivations, digital, MUX, de-MUX
The resistivity of conductive and semi-conductive materials, are determined using an algorithmic computation approach of Van der Pauw technique. Different geometrical shapes, such as bulk, surface, bars, wafers, are used are implemented. The four-point method has been extended to multi-point measurement of surface and volume geometrical shapes, with consequently rearranging the equations derived in Van der Pauw technique. It is proposed that the multi-point measurements derivations can be applied using a multiplexer (MUX) and a de-multiplexer (de-MUX) digital circuits, and further on, embedded microprocessors and microcontrollers.
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