An Innovative Method of Measuring Semiconductors Resistivity Using Van der Pauw Technique
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Full Text(PDF, 3000) PP.
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Author(s) |
Amir J. Majid |
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KEYWORDS |
resistivity, measurement, Van der Pauw, semiconductors, contacts, voltage coefficient, microcontrollers
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ABSTRACT |
Van der Pauw technique for measuring semiconductors resistivity is adopted to remove contacts and isolation effects on high resistance materials. An innovative digital method is proposed using, analog-to-digital (ADC) and digital-to-analog (DAC) circuits to reduce voltage coefficient, temperature coefficient and geometrical errors. With the aid of an N-bit timer and N-bit ADC and DAC, a set of 2N values of different values of current sources are applied and consequent voltage measurements are used in the calculation of resistivity. Consequently, a more accurate average is obtained with less voltage coefficient and temperature effects. This can be implemented by the use of embedded computers and micro controllers.
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References |
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