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International Journal of Scientific and Engineering Research
ISSN Online 2229-5518
ISSN Print: 2229-5518 10    
Website: http://www.ijser.org
scirp IJSER >> Volume 2, Issue 10, October 2011 Edition
An Innovative Method of Measuring Semiconductors Resistivity Using Van der Pauw Technique
Full Text(PDF, 3000)  PP.  
Amir J. Majid
resistivity, measurement, Van der Pauw, semiconductors, contacts, voltage coefficient, microcontrollers
Van der Pauw technique for measuring semiconductors resistivity is adopted to remove contacts and isolation effects on high resistance materials. An innovative digital method is proposed using, analog-to-digital (ADC) and digital-to-analog (DAC) circuits to reduce voltage coefficient, temperature coefficient and geometrical errors. With the aid of an N-bit timer and N-bit ADC and DAC, a set of 2N values of different values of current sources are applied and consequent voltage measurements are used in the calculation of resistivity. Consequently, a more accurate average is obtained with less voltage coefficient and temperature effects. This can be implemented by the use of embedded computers and micro controllers.
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