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International Journal of Scientific and Engineering Research
ISSN Online 2229-5518
ISSN Print: 2229-5518 12    
Website: http://www.ijser.org
scirp IJSER >> Volume 3,Issue 12,December 2012
Crystallographic Properties and Surface Analysis of Spin Coated YSZ Thin Films by Raman Spectroscopy, X-ray Diffraction and Scanning Electron Microscopy
Full Text(PDF, )  PP.158-161  
Author(s)
Shirley Tiong Palisoc, Simon Gerard Mendiola, Rose Ann Tegio, Michelle Natividad, Kevin Kaw, Stephen Tadios, Benjamin Tuason 
KEYWORDS
Yttria Stabilized Zirconmia,YSZ, spin-coating, thin film
ABSTRACT
Yttria Stabilized Zirconia (YSZ) thin films (<10 µm) were fabricated by spin coating technique on steel (Fe/ Cr18/ Ni10). The concentration ratio of YSZ powder to solvent were varied accordingly. The effects of these variations were investigated and discu
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