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International Journal of Scientific and Engineering Research
ISSN Online 2229-5518
ISSN Print: 2229-5518 4    
Website: http://www.ijser.org
scirp IJSER >> Volume 2, Issue 4, April 2011 Edition
Application of Reliability Analysis: A Technical Survey
Full Text(PDF, 3000)  PP.  
Author(s)
Dr. Anju Khandelwal
KEYWORDS
CCN, Coherent Systems, Distributed Computing Systems, Grid Computing, Nanotechnology, Network Reliability, Reliability.
ABSTRACT
The objective of this paper is to present a survey of recent research work of high quality that deal with reliability in different fields of engineering and physical sciences. This paper covers several important areas of reliability, significant research efforts being made all over the world. The survey provides insight into past, current and future trends of reliability in different fields of Engineering, Technology and medical sciences with applications with specific problems.
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