Resistivity Measurements of Conductors and Semiconductors of Different Geometrical Shapes Using Van der Pauw Technique
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Full Text(PDF, 3000) PP.
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Author(s) |
Amir J. Majid |
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KEYWORDS |
resistivity, Van der Pauw, conductors, semiconductors, shapes, geometries, equation derivations, digital, MUX, de-MUX
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ABSTRACT |
The resistivity of conductive and semi-conductive materials, are determined using an algorithmic computation approach of Van der Pauw technique. Different geometrical shapes, such as bulk, surface, bars, wafers, are used are implemented. The four-point method has been extended to multi-point measurement of surface and volume geometrical shapes, with consequently rearranging the equations derived in Van der Pauw technique. It is proposed that the multi-point measurements derivations can be applied using a multiplexer (MUX) and a de-multiplexer (de-MUX) digital circuits, and further on, embedded microprocessors and microcontrollers.
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References |
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