Enhanced Mode of Extended Set of Target Fault Techniques in Single Stuck - At Fault for Fault Coverage in Benchmark Circuits
Full Text(PDF, 3000) PP.
| Author(s) |
|P.Amutha, C.Arun Prasath|
| KEYWORDS |
Benchmark circuits, fault simulation, stuck-at faults, test quality, unresolved faults.
The undetectable single stuck-at faults in full-scan benchmark circuits tends to cluster in certain areas. This implies that certain areas may remain uncovered by a test set for single stuck-at faults. The extension to the set of target faults aimed at providing a better coverage of the circuit in the presence of undetectable single stuck-at fault.. The extended set of target faults consists of double stuck-at faults that include an undetectable fault as one of their components. The other component is a detectable fault adjacent to the undetectable fault. Test sets that contain several different tests for each fault (n-detection test sets) are expected to increase the likelihood of detecting defects associated with the sites of target faults. This phenomenon is discerned from the gate level description of the circuit, and it is independent of layout parameters. In addition, the clustering is based on the gate level, and remains valid for any layout of the circuit. The fault simulation and test generation for the extended set of target faults is simulated using modelsim.
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