Test Algorithms for Embedded Systems Testing [ ]


Now a days, embedded systems are used in day to day life. Though people of all ages are using embedded system in daily life they are totally unaware about it. As it is widely used as safety critical device, Testing are the main issue and a matter of concern for the manufacturers.Embedded systems are developed against the issues such as best performance, less power and low cost. Several faults occur while running embedded systems. Some of them are related to components, some are related to memories and some are related to interfacing with hardwares. All these errors can be easily removed via testing algorithms.This paper focuses on new test algorithms for testing of memory of embedded systems. It deals with on online testing of embedded system and also describes the various testing techniques. BIST (Built in Self Test) which is widely used for non concurrent system is also discussed in this paper.